An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-Johannes2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 185-190 : ill

Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, Anna2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 257-262 : ill https://ieeexplore.ieee.org/document/4711554