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1
book article
Back-traced deductive-parallel fault simulation for digital systems
Hahanov, Vladimir
;
Ubar, Raimund-Johannes
;
Hyduke, Stanley
Proceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 2003
2003
/
p. 370-377 : ill
https://ieeexplore.ieee.org/document/1231969
book article
2
book article
Combining fault analysis technologies for ISO26262 functional safety verification
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Hamdioui, Said
;
Sauer, Christian
2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings
2019
/
p. 129–134 : ill
https://doi.org/10.1109/ATS47505.2019.00024
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3
book article
Efficient methodology for ISO26262 functional safety verification
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Hamdioui, Said
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece
2019
/
p. 255-256
https://doi.org/10.1109/IOLTS.2019.8854449
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4
book article
Improving the confidence level in functional safety simulation tools for ISO 26262
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sauer, Christian
2018 Design and Verification Conference (DVCON) Europe : [proceedings]
2018
/
6 p. : ill
https://dvcon-proceedings.org/document/improving-the-confidence-level-in-functional-safety-simulation-tools-for-iso-26262/
https://zenodo.org/record/3361607#.Y0PHFnZByHs
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
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