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Marginal PCB assembly defect detection on DDR3/4 memory bus (title)

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book article EST / book article ENG

Marginal PCB assembly defect detection on DDR3/4 memory busOdintsov, Sergei; Jutman, Artur; Devadze, Sergei2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 20172017 / p. 238-247 : ill https://doi.org/10.1109/TEST.2017.8242070 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

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