Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
IEEE design & test of computers (source)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/9)
Export
export all inquiry results
(2)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article
Automated design error localization in RTL designs
Jenihhin, Maksim
;
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Raik, Jaan
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Bartsch, Günter
;
Meza Escobar, Jorge Hernan
;
Wuttke, Heinz-Dietrich
IEEE design & test of computers
2014
/
p. 83-92 : ill
http://dx.doi.org/10.1109/MDAT.2013.2271420
journal article
2
journal article
Test synthesis with alternative graphs
Ubar, Raimund-Johannes
IEEE design & test of computers
1996
/
Spring, p. 48-57: ill
journal article
Number of records 2, displaying
1 - 2
keyword
9
1.
IEEE 9 bus test system
2.
design and test
3.
design-for-test
4.
Digital test and testable design
5.
parallel design and test
6.
teaching design and test of systems
7.
test model design
8.
design methodology and human-centred design
9.
computers in education
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT