10th IEEE European Test Symposium (title)

types of item

  • journal article
    10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106
    journal article
Number of records 1, displaying 1 - 1