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2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings (source)
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book article
TAS : Ternarized Neural Architecture Search for Resource-Constrained Edge Devices
Loni, Mohammad
;
Mousavi, Hamid
;
Riazati, Mohammad
;
Daneshtalab, Masoud
;
Sjödin, Mikael
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
2022
/
p. 1115-1118
https://doi.org/10.23919/DATE54114.2022.9774615
book article
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keyword
9
1.
test automation
2.
design automation
3.
electronic design automation
4.
design and test
5.
design-for-test
6.
Digital test and testable design
7.
parallel design and test
8.
teaching design and test of systems
9.
test model design
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1.
18th Biennial Baltic Electronics Conference (BEC) 2022
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