Measurement of transistor low frequency noise source parameters (title)

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  • book article
    Measurement of transistor low frequency noise source parametersZeltinš, M.; Slaidinš, I.BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 475-478: ill
    book article
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