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Benso, A. (author)
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book article
A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs
Benso, A.
;
Prinetto, Paolo
;
Rebaudengo, M.
;
Sonza, M.
;
Ubar, Raimund-Johannes
Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997
1997
/
p. 560-565
book article
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book article
Exploiting high-level descriptions for circuits fault tolerance assessments
Benso, A.
;
Prinetto, Paolo
;
Rebaudengo, M.
;
Sonza Reorda, Matteo
;
Raik, Jaan
;
Ubar, Raimund-Johannes
1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 1997
1997
/
p. 212-216
book article
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