Searching - TalTech Research Portal

Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997 (source)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

export all inquiry results (1)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

A new approach to build a low-level malicious fault list starting from high-level description and alternative graphsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza, M.; Ubar, Raimund-JohannesProceedings IEEE European Design & Test Conference, Paris, March 17-20, 19971997 / p. 560-565 https://ieeexplore.ieee.org/document/582417

book article

Number of records 1, displaying 1 - 1