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ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992 (source)

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Failure prediction of power devices under reverse surge current conditionsFreidin, Boris; Velmre, Enn; Udal, AndresISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 19921992 / p. 118-123: fig https://doi.org//10.1109/ISPSD.1992.991247

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