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Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999 (source)

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Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill https://www.sciencedirect.com/science/article/pii/S0026271499002036

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