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Proc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 1999 (source)

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FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123 https://masters.donntu.ru/2010/fknt/masyakin/library/article7.pdf

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