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Design error localization in digital circuits by stuck-at fault test patterns (title)
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book article
Design error localization in digital circuits by stuck-at fault test patterns
Jutman, Artur
;
Ubar, Raimund-Johannes
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
2000
/
p. 723-726
https://ieeexplore.ieee.org/document/838792
book article
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keyword
14
1.
design error localization
2.
Digital test and testable design
3.
stuck-at fault model
4.
error localization
5.
fault localization
6.
spectrum-based fault localization
7.
bit-error rate test
8.
test patterns
9.
online design error debug
10.
design patterns
11.
digital circuits
12.
digital circuits and systems
13.
Multi-valued Simulation for Hazard Detection in Digital Circuits
14.
Structural Decision Diagrams for Modeling Digital Circuits
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