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Fast and efficient static compaction of test sequences based on greedy algorithms (title)
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book article
Fast and efficient static compaction of test sequences based on greedy algorithms
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 117-122
https://slideplayer.com/slide/9971880/#google_vignette
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keyword
5
1.
rtioco-based timed test sequences
2.
greedy and branch & bound algorithms
3.
deterministic test sequences
4.
static load test
5.
static-dynamic probing test (SDT)
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