Design error diagnosis in scan-path designs (title)

—
—
—
—
Add criteria Advanced search filter
Clear
types of item

  • book article
    Design error diagnosis in scan-path designsUbar, Raimund-Johannes2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers2001 / p. 162-168 : ill
    book article
Number of records 1, displaying 1 - 1