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European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings (source)
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1
book article
DOT: new deterministic defect-oriented ATPG tool
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Sudbrock, Joachim
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 96-101 : ill
book article
2
book article
Energy minimization for hybrid BIST in a system-on-chip test environment
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
;
Jervan, Gert
;
Peng, Zebo
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 2-7 : ill
book article
Number of records 2, displaying
1 - 2
CV
17
1.
Habicht, Kalju 1927-2005
2.
Heinlo, Heino 1934-2005
3.
Help, Kalju 1929-2005
4.
Hödrejärv, Ulrich 1927-2005
5.
Illend, Juhan-Eduard 1943-2005
6.
Kadak, Albert-Martin 1917-2005
7.
Kivirähk, Elvine 1929-2005
8.
Kont, Helmi 1912-2005
9.
Krieger, Enno 1942-2005
10.
Lebbin, Herbert-Armin 1913-2005
11.
Liik, Olev 1957-2005
12.
Moon, Hele-Riin (2005-2012)
13.
Möldre, Leili 1942-2005
14.
Teetsov, Ants 1926-2005
15.
Teinveld, Villo 1923-2005
16.
Tihase, Karl 1914-2005
17.
Viiret, Edmund Nikolai 1916-2005
name of the person
7
1.
Johannes Paulus II, paavst, 1920-2005
2.
Kulpa, Helene, 1910-2005
3.
Lepmets, Tõnno, 1938-2005
4.
Liik, Olev, 1957-2005
5.
Teetsov, Ants, 1926-2005
6.
Tihase, Karl, 1914-2005
7.
Ugi, Ivar Karl, 1930-2005
subject term
2
1.
European Test Symposium (ETS)
2.
2005-2012
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