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41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper (source)
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book article
Decision diagrams and digital test
Ubar, Raimund-Johannes
41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper
2005
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p. 15-26
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