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Fast fault simulation for extended class of faults in scan-path circuits (title)

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Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19 https://ieeexplore.ieee.org/document/5438717

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