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Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France (source)
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book article
Embedded synthetic instruments for board-level testing
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
;
Wenzel, Thomas
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p. : ill
book article
2
book article
FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems design
Raik, Jaan
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
https://ieeexplore.ieee.org/document/6233052
book article
3
book article
Re-using chip level DFT at board level
Gu, Xinli
;
Jutman, Artur
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
book article
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European Test Symposium (ETS)
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