• Ab inito study of GaN properties using VASP software packageKlopov, Mihhail; Kuusk, Ahto; Velmre, Enn; Udal, AndresBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 55-58 : ill
  • Analysis of peak current for current crowding effect in 4H- and 6H-SiC Schottky structuresKurel, Raido; Rang, ToomasThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 235-236 : ill
  • Analysis of the basic Schottky parameters for diffusion-welded aluminium contacts to p- and n-type SiCKorolkov, Oleg; Ljutov, Jevgeni; Kuznetsova, Natalja; Ruut, Jana; Rang, ToomasBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 51-53 : ill
  • Apparent decrease of diffusion coefficients due to the plasma-induced band gap narrowingUdal, Andres; Velmre, Enn19th Nordic Semiconductor Meeting : May 20-23, 2001, Copenhagen, Denmark : abstracts2001 / p. 22 : ill
  • Automatic vessel identification systemHaavel, Rein; Tani, HarryBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 181-182 : ill
  • Basics of electrical measurement : general courseTamm, Uljas2003 https://www.ester.ee/record=b1828296*est
  • BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 http://www.ester.ee/record=b2150914*est
  • BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 http://www.ester.ee/record=b2150914*est
  • BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics ConferenceRang, Toomas2006 http://www.ester.ee/record=b2150914*est
  • BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 http://www.ester.ee/record=b2150914*est
  • BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 4-6, 2010, Tallinn, EstoniaRang, Toomas2010 http://www.ester.ee/record=b2150914*est
  • A brief survey of exciton concentration models for SiVelmre, Enn; Udal, AndresThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 19-22 : ill
  • [Christou, A. Integrating reliability into microelectronics manufacturing. Series on design and measurement in electronic engineering, edited by D.V.Morgan and H.L.Grubin. Wiley, Chichester, 1994. 349 p. : Book review]Velmre, EnnEngineering applications of artificial intelligence1996 / p. 97 https://www.ester.ee/record=b1200126*est
  • The class of test signals for dynamic testing of AD convertersLand, RaulThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 127-128 : ill
  • Classical electrodynamics, charge distributions of currents and the metal transistorTaniloo, RainerBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 61-64 : ill
  • CMOS SP chip for resistor type semiconductor gas sensorsKasemaa, Argo; Rang, ToomasThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 255-256 : ill
  • Compact smart home systems : design and verification of cost effective hardware solutionsKuusik, Alar2001 http://www.ester.ee/record=b1622134*est
  • Comparative characteristics of diffusion welded Al contacts to 6H- and 4H-SiC substratesKorolkov, Oleg; Rang, ToomasThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 23-26 : ill
  • Comparison of methods for solving the Schrödinger equation for multiquantum well heterostructure applicationsUdal, Andres; Reeder, Reeno; Velmre, Enn; Harrison, PaulProceedings of the Estonian Academy of Sciences. Engineering2006 / p. 246-261 : ill
  • Comparison of Si and SiC devices surge current capability by means of numerical simulationsVelmre, Enn; Udal, AndresBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 77-80: ill
  • Control and remote monitoring system of Aids to NavigationHaavel, Rein; Heinla, Ü.; Käärmann, L.; Pikpoom, T.; Rebane, R.; Tani, HarryBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 207-210 : ill
  • Corrected accounting of electron-hole scattering in cross-term current equations for Si and SiCVelmre, Enn; Udal, Andres18th Nordic Semiconductor Meeting, Linköping, June 7-10, 1998 : abstracts1998 / p. F-88: ill https://iopscience.iop.org/article/10.1238/Physica.Topical.079a00193
  • Department of ElectronicsMin, Mart; Parve, Toomas; Laansoo, Ants; Männama, Vello; Velmre, Enn; Udal, AndresResearch activities / Tallinn Technical University1993 / p. 79-81 https://www.ester.ee/record=b1053754*est
  • Digitaalelektroonika : laboratoorsete tööde kogumik1994 http://www.ester.ee/record=b1065462*est
  • Digitaalelektroonika alused : skeemid : abimaterjal loengute jälgimise ja konspekteerimise hõlbustamiseks1994 https://www.ester.ee/record=b1065765*est
  • DSP-based device for multi-frequency bio-impedance measurementMärtens, OlevMedical & biological engineering & computing1999 / Suppl. 1, Proceedings of the 11th Nordic-Baltic Conference on Biomedical Engineering : NBCBME'99 : June 6-10, 1999, Tallinn, Estonia, p. 165-170
  • EessõnaMeister, Ants; Tamm, UljasElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 4 https://www.ester.ee/record=b1399956*est
  • Electrical bioimpedance measurement : methods and equivalent circuitsGordon, Rauno; Parve, ToomasBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 363-366 : ill
  • Electronic circuits : examples for project based subject "Technologies of electronic products"Sillakivi, Peeter; Tamm, Uljas2003 https://www.ester.ee/record=b1828290*est
  • Elektrimõõtmiste alused : ülevaatekursus2003 http://www.ester.ee/record=b1782612*est
  • Elektrisüsteemi talitluse seireMeldorf, Mati1995 http://www.ester.ee/record=b1069180*est
  • Elektronlülitused : näidisskeemid projektipõhilisele õppeainele "Elektrontoodete tehnoloogiad"2003 https://www.ester.ee/record=b1828299*est
  • Elektroonika - mis see on?Rang, ToomasElektroonika 2004 : XI rahvusvahelise telekommunikatsioonipäeva materjalid2004 / lk. 7-9 https://www.ester.ee/record=b1910557*est
  • Elektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 https://www.ester.ee/record=b1399956*est
  • Elektroonika desintegratsioonVelmre, EnnTallinna Tehnikaülikooli aastaraamat 20022003 / lk. 33-38 https://www.ester.ee/record=b1212786*est
  • Elektroonika Eestis - tööstus, teadus, haridus - järelmõtteidRang, ToomasInsenerikultuur Eestis. 31997 / lk. 139-147 https://www.ester.ee/record=b1063622*est
  • Elektroonika komponendid : loengukonspektKasemaa, Argo2003 http://www.ester.ee/record=b1782506*est
  • Elektroonika kui Eesti innovatsioonisüsteemi infrastruktuurMin, Mart; Rang, Toomas; Ubar, Raimund-JohannesEesti teadlaste kongress, 11.-15. augustini 1996. a. Tallinnas : ettekannete kokkuvõtted1996 / lk. 265 https://www.ester.ee/record=b1052731*est
  • Elektroonikainseneride harimisest meil ja mujalRang, ToomasElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 7-14 https://www.ester.ee/record=b1399956*est
  • Elektroonikud ettevõtluses : teadus, arendus, äriMin, MartElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 15-18 https://www.ester.ee/record=b1399956*est
  • Exercises. Final test questions : supplementary material in the course "Microelectronics"Rang, Toomas2003 https://www.ester.ee/record=b1766979*est
  • ForewordRang, Toomas; Min, Mart; Ubar, Raimund-JohannesBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 3 https://www.ester.ee/record=b2150914*est
  • Formal safety validation of mobile robot teleoperationVain, Jüri; Suzuki, Satoshi; Kuusik, AlarBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 161-164 : ill
  • 40 years of Electronics Department at Tallinn Technical UniversityTamm, Uljas; Velmre, EnnBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 7-10 https://www.ester.ee/record=b2150914*est
  • Frequency pattern fitting in an extended block-adaptive Fourier analyser - I: indispensable restrictionsRonk, AntsBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 153-156 : ill
  • Frequency pattern fitting in an extended block-adaptive Fourier analyser - II: ordering of frequencies and fitting of them on disjoint sets of valuesRonk, AntsBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 217-220
  • Frequency pattern fitting in an extended block-adaptive Fourier analyser - III: necessary detuningsRonk, AntsBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 221-224 : ill
  • Heart bioimpedance 3D FDM modelling with anisotropic tissue propertiesGordon, RaunoBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 175-178 : ill
  • High phonon-drag thermoelectric efficiency of SiC at low temperaturesVelmre, Enn; Udal, Andres; Grivickas, VytautasFinal program of the 10th International Conference on SiC and Related Materials : ICSCRM'2003 : Lyon, France, Oct. 5-10, 20032003 / p. ThP4-13 https://www.researchgate.net/publication/240834700_High_Phonon-Drag_Thermoelectric_Efficiency_of_SiC_at_Low_Temperatures
  • Impact of phonon-drag effect on Seebeck coefficient in SiC : experiment and simulationBikbajevas, V.; Grivickas, V.; Stölzer, M.; Velmre, Enn; Udal, AndresAbstracts of the Lithuanian National Physics Conference : LNPK-34 : Vilnius, 20032003 / p. 219 http://www.diva-portal.org/smash/record.jsf?pid=diva2%3A269444&dswid=8596
  • Improvement of switching lock-in signal conversion in bioimpedance analysersParve, Toomas; Land, Raul; Min, Mart; Poola, GustavBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 179-182 : ill
  • Influence of excitonic scattering on charge carrier ambipolar diffusion in siliconUdal, Andres; Velmre, EnnESSDERC'97 : proceedings of the 27th European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 19971997 / p. 212-215: ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1503333 https://doi.org////10.1109/ESSDERC.1997.194403
  • Intracardiac bio-impedance measurement for cardiac rhythm controlHolmström, Nils; Järverud, Karin; Min, Mart; Noren, Kjell; Parve, ToomasMedical & biological engineering & computing1999 / Suppl. 1, Proceedings of the 11th Nordic-Baltic Conference on Biomedical Engineering : NBCBME'99 : June 6-10, 1999, Tallinn, Estonia, p. 163-164: ill
  • Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodesVelmre, Enn; Udal, AndresSilicon carbide and related materials 20062007 / p. 375-378 https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes
  • Kalman Tarnay (1929 - 1998)Rang, ToomasThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. V : portr
  • Kui vana on elektroonika?Velmre, EnnElektroonika 2004 : XI rahvusvahelise telekommunikatsioonipäeva materjalid2004 / lk. 53-56 https://www.ester.ee/record=b1910557*est
  • Kui vana on elektroonika? : ettekanne rahvusvahelise telekommunikatsioonipäeva konverentsil "Elektroonika 2004" 14. mail 2004 TTÜsVelmre, EnnTallinna Tehnikaülikooli aastaraamat 20042005 / lk. 291-296 : ill https://www.ester.ee/record=b1212786*est
  • KunstninaKasemaa, ArgoElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 95-102 : ill https://www.ester.ee/record=b1399956*est
  • Laterally pumped GaAs/AlGaAs quantum wells as sources of broadband tetrahertz radiationReeder, Reeno; Ikonic, Zoran; Harrison, Paul; Udal, Andres; Velmre, EnnJournal of applied physics2007 / [6] p. : ill https://pubs.aip.org/aip/jap/article/102/7/073715/987937/Laterally-pumped-GaAs-AlGaAs-quantum-wells-as
  • Low power SC structures with low threshold MOS switchesMännama, Vello; Sabolotny, ReinThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 75-78 : ill
  • LPE structures for power GaAs rectifiersVoitovitš, ViktorThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 237-240 : ill https://artiklid.elnet.ee/record=b1005558*est
  • Measurement of charge carrier lifetime temperature dependence in 4H-SiC power diodesVelmre, Enn; Udal, AndresAbstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA1999 / paper no 394, 2 p https://www.researchgate.net/publication/240833834_Measurement_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Power_Diodes
  • Modeling and simulation of bipolar semiconductor devices : authors's main publicationsVelmre, Enn1996 http://www.ester.ee/record=b2079366*est
  • Modeling of charge carrier non-isothermal transport parameters in siliconVelmre, Enn; Udal, AndresBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 71-74: ill
  • Modeling of photon recycling in GaN-devicesVelmre, Enn; Udal, Andres; Klopov, Mihhail5th European Conference on Silicon Carbide and Related Materials : book of abstracts : 31 August-4 September 2004, Bologna, Italy2004 / p. 317-318 https://www.researchgate.net/publication/250344144_Modeling_of_Photon_Recycling_in_GaN-Devices
  • Modeling of the PLL-based bioimpedance measurement systemPaavle, Toivo; Min, MartBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 183-186 : ill
  • Modelling of Seebeck coefficient influenced by carrier phonon drag and mixed scatteringMilatškov, MilkoBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 57-60 : ill
  • Modelling of the tunneling current in metal alloy contacts to 6H- and 4H-SiC substratesRang, ToomasMICROSIM II : simulation and design of microsystems and microstructures1997 / p. 23-31 : ill
  • A modified frequency error estimator for the block adaptive Fourier analyzerRonk, AntsThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 103-106 : ill https://www.ester.ee/record=b2150914*est
  • Multisine dynamic EBI spectrum analyser for in vivo experimentsMin, Mart; Märtens, Olev; Parve, ToomasMedical & biological engineering & computing1999 / Suppl. 2, Proceedings of the European Medical & Biomedical Engineering Conference : EMBEC'99 : November 4-7, 1999, Vienna, Austria. Part 1, p. 144-145
  • Nanotehnoloogiat meilt ja mujaltVelmre, EnnElektriala2005 / lk. 22-24 : ill
  • Negative resistance structures : optimization of power balanceTaniloo, RainerThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 353-354 : ill
  • Numerical investigation of digitised parabolic quantum wells for terahertz AIGaAs/GaAs structuresReeder, Reeno; Udal, Andres; Velmre, Enn; Harrison, PaulBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 51-54 : ill
  • Numerical study of turn-off phenomenon in complementary 4H-SiC JBS rectifiersRang, Toomas; Kurel, Raido; Higelin, G.BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 47-50 : ill
  • Näidisülesanded. Test : abimaterjal ainele "Mikroelektroonika"2003 http://www.ester.ee/record=b1766976*est
  • One bio-medical multisine measurement task: solution principlesRonk, Ants; Min, MartBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 199-200 : ill
  • Phase insensitivity in the charge pump phase locked loopsPaavle, ToivoElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / p. 78-86 : ill https://www.ester.ee/record=b1399956*est
  • Phase-domain modeling of the PLL frequency synthesizersPaavle, ToivoBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 173-176 : ill
  • Phase-frequency detector modeling for the PLL applicationsMännama, Vello; Paavle, ToivoThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 119-122 : ill
  • Plaan 3000PlussRang, ToomasMente et Manu2010 / lk. 3 : fot https://artiklid.elnet.ee/record=b2286893*est
  • Pooljuhtkomponentide simuleerimine arvutil : laboratoorse töö juhend2003 http://www.ester.ee/record=b1766958*est
  • Precision AC/DC measurement converters with switched capacitors in the feedback path = Täpsed vahelduvpinge mõõtemuundurid ümberlülituvate kondensaatoritega tagasiside ahelasMärtens, Olev1993 http://www.ester.ee/record=b2089954*est
  • PrefaceRang, ToomasBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 3-4 https://www.ester.ee/record=b2150914*est
  • PrefaceRang, ToomasBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. III https://www.ester.ee/record=b2150914*est
  • PrefaceRang, ToomasThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. III https://www.ester.ee/record=b2150914*est
  • PrefaceRang, ToomasBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. III https://www.ester.ee/record=b2150914*est
  • PrefaceRang, ToomasBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 3-4 https://www.ester.ee/record=b2150914*est
  • Preliminary approach to the timing measurements for reverse recovery applied to the SiC Schottky diode modelPikkov, MihhailThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 321-322 : ill
  • Preliminary investigation of diffusion welded contacts to p-type 6H-SiCKorolkov, Oleg; Rang, Toomas; Kuznetsova, Natalja; Ruut, JanaBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 55-56 : ill
  • Principles of semiconductor structures. Realisation of structures in crystals : supplementary lecture material in the subject "Microelectronics"Rang, Toomas2003 http://www.ester.ee/record=b1782565*est
  • Product and manufacturing in electronics : supplementary material in the subject "Technologies of electronic circuits"Rang, Toomas2003 https://www.ester.ee/record=b1766953*est
  • Pseudorandom sampling in a multi-frequency bioimpedance analyserMärtens, Olev; Min, MartBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 253-256 : ill
  • SC structures with low-threshold MOS switchesMännama, Vello; Sabolotny, ReinBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 119-122 : ill
  • A set-up for investigation of post-ischaemic recovery of isolated animal heart based on dynamic measurement of pressure, flow, and electrical bioimpedanceRätsep, Indrek; Kink, Andres; Taal, Günter; Parve, ToomasBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 367-370 : ill
  • SiC-diodes forward surge current failure mechanisms : experiment and simulationVelmre, Enn; Udal, AndresESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France1997 / p. 1671-1674 https://www.sciencedirect.com/science/article/abs/pii/S0026271497001364
  • SiC-diodes forward surge current failure mechanisms : experiment and simulationUdal, Andres; Velmre, EnnMicroelectronics reliability1997 / p. 1671-1674 https://doi.org/10.1016/S0026-2714(97)00136-4
  • Simulation of semiconductor components on PC-s : instruction for laboratory workKurel, Raido2003 http://www.ester.ee/record=b1766967*est
  • Smart houseKuusik, AlarIntegrated systems and design : interstudy, May 9, 20082008 / p. 65-72
  • SoC based mobile robot telecontrol systemKuusik, AlarBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 153-154 : ill
  • The structure of FET-based negative differential resistance for microwave and neural network applicationsTaniloo, RainerBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 73-76 : ill
  • Study of radiative recombination influence in GaN and GaAs bipolar transistor structuresVelmre, Enn; Udal, Andres; Verbitski, IrinaBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 59-62 : ill
  • Tallinna Tehnikaülikool ja Elcoteq Tallinn AS elektroonikainseneride ettevalmistuse ühisrindelRang, ToomasElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 19-20 https://www.ester.ee/record=b1399956*est
  • Termoelektri avastaja Thomas Johann Seebeck : [ettekanne rahvusvahelisel seminaril 11. mail 2007 TTÜs]Velmre, EnnTallinna Tehnikaülikooli aastaraamat 20072008 / lk. 335-339
  • The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 https://www.ester.ee/record=b2150914*est
  • A theoretical study of electron drift mobility anisotropy in n-type 4H- and 6H-SiCVelmre, Enn; Udal, AndresAbstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA1999 / paper no 395, 2 p https://www.researchgate.net/publication/250338907_A_Theoretical_Study_of_Electron_Drift_Mobility_Anisotropy_in_n-Type_4H-and_6H-SiC
  • A theoretical study of electron drift mobility anisotropy in n-type 4H- and 6H-SiCVelmre, Enn; Udal, AndresMaterials science forum2000 / p. 725-728
  • Thermopower measurements in 4H-SiC and Theoretical calculations considering the phonon drag effectGrivickas, V.; Stölzer, M.; Velmre, Enn; Udal, Andres; Grivickas, P.; Syväjärvi, M.; Yakimova, R.; Bikbajevas, V.Abstracts of the 3rd European Conference on Silicon Carbide and Related Materials : ECSCRM'2000 : Sept. 3-7, 2000, Kloster Banz, Germany2000 / p. 144
  • Thermopower measurements in 4H-SiC and theoretical calculations considering the phonon drag effectGrivickas, Vytautas; Stölzer, M.; Velmre, Enn; Udal, Andres; Grivickas, Paulius; Syväjärvi, Mikael; Yakimova, Rositza; Bikbajevas, V.Silicon Carbide and Related Materials : ECSCRM2000 : proceedings of the 3rd European Conference on Silicon Carbide and Related Materials : Kloster Banz, Germany, September 20002001 / p. 491-494 : ill https://www.researchgate.net/publication/240833914_Thermopower_Measurements_in_4H-SiC_and_Theoretical_Calculations_Considering_the_Phonon_Drag_Effect
  • Thomas Johann Seebeck (1770-1831)2007 http://www.ester.ee/record=b2285820*est
  • Toode ja tootmine elektroonikas : abimaterjal ainele "Elektroonikaskeemide tehnoloogiad"2003 http://www.ester.ee/record=b1766950*est
  • Two-dimensional nonisothermal analysis of the current crowding effect at nonuniform SiC Schottky contacts using device simulator DYNAMIT-2DTKurel, Raido; Udal, AndresBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 51-54 : ill
  • Täpsete järgivsüsteemide dünaamika uurimine : magistritööTammemägi, Jaak1995 https://www.ester.ee/record=b2078796*est
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