• Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill
• An ontology-based intelligent learning object for teaching the basics of digital logicRobal, Tarmo; Kann, Taavi; Kalja, Ahto2011 IEEE International Conference on Microelectronic Systems Education (MSE) : 5-6 June 2011, San Diego, CA, USA2011 / p. 106-107
• Application of structurally synthesized binary decision diagrams for timing simulation of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 269-288 : ill
• BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)Rang, Toomas; Min, Mart; Ubar, Raimund-Johannes1994
• BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)1994 https://www.ester.ee/record=b2150914*est
• BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, EstoniaRang, Toomas2002 http://www.ester.ee/record=b2150914*est
• BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 https://www.ester.ee/record=b1982896*est
• BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 http://www.ester.ee/record=b2150914*est
• BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics ConferenceRang, Toomas2006 http://www.ester.ee/record=b2150914*est
• BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, EstoniaRang, Toomas2008 http://www.ester.ee/record=b2150914*est
• BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 4-6, 2010, Tallinn, EstoniaRang, Toomas2010 http://www.ester.ee/record=b2150914*est
• BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 http://www.ester.ee/record=b2150914*est
• BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, EstoniaRang, Toomas2014 http://www.ester.ee/record=b2150914*est
• BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, EstoniaRang, Toomas2016 http://www.ester.ee/record=b2150914*est
• BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedingsRang, Toomas; Min, Mart; Ubar, Raimund-Johannes1996 https://www.ester.ee/record=b2150914*est
• BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedingsRang, Toomas1998 https://www.ester.ee/record=b2150914*est
• A BIST scheme for testing mixed analogue and digital circuitsRobson, Malcolm; Russel, GordonBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 183-186: ill
• Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill
• Calculation of the diagnosibility of digital circuits without using fault modelsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 159-162 : ill
• Case study in testing digital systemsUbar, Raimund-JohannesBaltic electronics1995 / 1, p. 24-27
• A CMOS quadrature baseband frequency synthesizer/modulatorKosunen, Marko; Vankka, Jouko; Waltari, Mikko; Sumanen, Lauri; Koli, Kimmo; Halonen, KariBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 219-222: ill
• Collaborative distributed computing in the field of digital electronics testingIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesBalanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings2010 / p. 145-152
• Collaborative distributed fault simulation for digital electronic circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesIntelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 20102010 / p. 67-76
• Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86
• Digitaalelektroonika : laboratoorsete tööde kogumik1994 http://www.ester.ee/record=b1065462*est
• Digitaalelektroonika alused : skeemid : abimaterjal loengute jälgimise ja konspekteerimise hõlbustamiseks1994 https://www.ester.ee/record=b1065765*est
• Digitaali disain - ideest realisatsiooniniEllervee, PeeterA & A2008 / lk. 6-10 : ill https://artiklid.elnet.ee/record=b1021438*est
• Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est
• Digitaalsüsteemide diagnostika Tallinna TehnikaülikoolisUbar, Raimund-JohannesTeadusmõte Eestis : tehnikateadused2002 / lk. 107-113 : ill
• Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est
• Distributed approach for genetic test generation in the field of digital electronicsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIntelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 20082008 / p. 127-136
• Dynamic analysis of digital circuits with 5-valued simulationUbar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 187-192: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_29
• Effective self adaptive multiple source localization technique by primal dual interior point method in binary sensor networksKhan, Muhidul Islam; Xia, KewenIEEE communications letters2017 / p. 1119-1122 : ill https://doi.org/10.1109/LCOMM.2017.2657508
• E-learning environment in the area of digital microelectronicsJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2004 : proceedings of the Fifth International Conference on Information Technology based Higher Education and Training : 31 May - 2 June, 2004, Istanbul, Turkey2004 / p. 278-283 : ill
• E-learning of digital logicRobal, Tarmo; Brik, Marina; Aarna, MargitEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 120-123 : ill
• E-learning tools for teaching self-test of digital electronicsJutman, Artur; Gramatova, Elena; Pikula, T.; Ubar, Raimund-Johannes15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 20042004 / p. 267-272 : ill
• E-learning tools for teaching the decomposition based digital synthesisSudnitsõn, Aleksander; Kruus, MargusEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 63-66 https://pld.ttu.ee/~kruus/EWME_06_sudn.pdf
• Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 https://www.scopus.com/sourceid/19400157163 https://www.scopus.com/record/display.uri?eid=2-s2.0-84990032811&origin=inward&txGid=0d26bc6e9683eda5b12413cb88f860aa https://www.webofscience.com/wos/woscc/full-record/WOS:000392266400002
• FPGA platform based digital design educationMihhailov, Dmitri; Kruus, Margus; Sudnitsõn, AleksanderProceedings of the 9th International Conference on Computer Systems and Technologies and Workshop for PhD Students in Computing : CompSysTech'2008. Vol. 374, ACM International Conference Proceeding Series2008 / p. IV.4-1 - IV.4-6 : ill https://dl.acm.org/doi/pdf/10.1145/1500879.1500938
• Functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 19931993 / p. 545-546
• Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200
• Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529
• Hybrid built-in self-test and test generation techniques for digital systemsJervan, Gert2005 https://www.ester.ee/record=b2177537*est
• Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435
• Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est
• Methods for improving the accuracy and efficiency of fault simulation in digital systems = Meetodid digitaalsüsteemide rikete simuleerimise täpsuse ja efektiivsuse tõstmiseksKõusaar, Jaak2019 https://digi.lib.ttu.ee/i/?11667
• MikroprotsessortehnikaLehtla, Tõnu; Kulmar, Lembit1995 https://www.ester.ee/record=b1054894*est
• Module level defect simulation in digital circuitsKuzmicz, Wieslaw; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 253-268
• Multi-valued simulation of digital circuits with structurally synthesized binary decision diagramsUbar, Raimund-JohannesMultiple valued logic. Vol. 41998 / p. 141-157
• Overview of digital twin platforms for EV applicationsMohamed, Mahmoud Ibrahim Hassanin; Rjabtšikov, Viktor; Gilbert, RolandoSensors2023 / art. 1414, 15 p. : ill https://doi.org/10.3390/s23031414 https://www.scopus.com/sourceid/130124 https://www.scopus.com/record/display.uri?eid=2-s2.0-85147992220&origin=inward&txGid=ac5ae06c5f7fa32436d2e194c5037ddc https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SENSORS-BASEL&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:000931369200001
• Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf
• Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est
• Silmade asemel, ehk, Lihtne digitaalne ostsilloskoop arvutileSinivee, VeljoArvutikasutaja2005 / 2, lk. 10-12 : ill https://artiklid.elnet.ee/record=b1050354*est
• Simulation-based verification with APRICOT framework using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesEast-West Design & Test Symposium : Moscow, September 18-21, 20092009 / p. 13-16 : ill
• Sissejuhatus digitaaltehnikasseLehtla, Madis2016 http://www.ester.ee/record=b4618200*est
• Testentwurf für digitale Geräte mit Hilfe der AlternativgraphenVoolaine, Andrus; Pall, Martin; Plakk, MariFehler in Automaten1989 / S. 31-44 : Ill
• The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedingsRang, Toomas2000 https://www.ester.ee/record=b2150914*est
• A tool for teaching hierarchical fault diagnosis in digital circuitsUbar, Raimund-Johannes; Kostin, Sergei; Orasson, Elmet; Evartson, Teet; Brik, MarinaProceedings of 9th European Workshop on Microelectronics Education – EWME’12 : Grenoble, France, May 9-11, 20122012 / p. 1-4
• Trabajadores de la economía gig en la Unión Europea : hacia un cambio en su clasificación jurídicaKerikmäe, Tanel; Kajander, Aleksi Oskar JohannesRevista CIDOB d'afers internacionals2022 / p. 117-139 https://doi.org/10.24241/rcai.2022.131.2.117
• Turbo Tester : a low cost PC-based CAD system for training digital testUbar, Raimund-JohannesSampTA'95 : 1995 Workshop on Sampling Theory & Applications, Jurmala, Latvia, September 20-22, 19951995
• Tööstuses toimuvaid protsesse saab nüüdsest jälgida reaalajasShirokova, Veroonikatoostusuudised.ee2022 https://www.toostusuudised.ee/uudised/2022/12/27/toostuses-toimuvaid-protsesse-saab-nuudsest-jalgida-reaalajas
• Tööstuses toimuvaid protsesse saab nüüdsest jälgida reaalajasShirokova, VeroonikaMente et Manu2022 / lk. 43 https://www.ester.ee/record=b1242496*est