• Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill
• Automated software-based self-test generation for microprocessorsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonProceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 20142017 / p. 453-458 : ill https://doi.org/10.23919/MIXDES.2017.8005252
• New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill
• On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357
• Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill
• Using STLs for effective in-field test of GPUsRodriguez Condia, Josie E.; Da Silva, Felipe Augusto; Bagbaba, Ahmet Cagrl; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo SonzaIEEE Design and Test2023 / p. 109-117 https://doi.org/10.1109/MDAT.2022.3188573 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-85134217319&origin=inward&txGid=5c55e6f09f3a758ff423ba6cdbf70264 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001060451700010