• Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill https://doi.org/10.1007/s10836-016-5588-y https://www.scopus.com/sourceid/18040 https://www.scopus.com/record/display.uri?eid=2-s2.0-84964452131&origin=inward&txGid=035b6825dd1a37b925ec9c823fcecd7d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016 https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900002
• Virtual reconfigurable scan-chains on FPGAs for optimized board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Shibin, Konstantin2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102411