• A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est
• Hardware trojan insertion in finalized layouts : from methodology to a silicon demonstrationPerez, Tiago Diadami; Pagliarini, Samuel NascimentoIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems2023 / p. 2094-2107 https://doi.org/10.1109/TCAD.2022.3223846 https://www.scopus.com/sourceid/27724 https://www.scopus.com/record/display.uri?eid=2-s2.0-85144011739&origin=resultslist&sort=plf-f&src=s&sid=f6bea21f940b112407e8b3b930cd5a56&sot=b&sdt=b&s=DOI%2810.1109%2FTCAD.2022.3223846%29&sl=141&sessionSearchId=f6bea21f940b112407e8b3b930cd5a56 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20COMPUT%20AID%20D&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:001017411600002
• High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167
• Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105
• Logic IP for low-cost IC design in advanced CMOS nodesIsgenc, Mehmet Meric; Martins, Mayler G.A.; Zackriya, V. Mohammed; Pagliarini, Samuel Nascimento; Pileggi, LarryIEEE Transactions on Very Large Scale Integration (VLSI) Systems2020 / p. 585-595 https://doi.org//10.1109/TVLSI.2019.2942825
• Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 https://www.scopus.com/sourceid/56190 https://www.scopus.com/record/display.uri?eid=2-s2.0-85057101928&origin=inward&txGid=49e361500f6fe5902264fae2d90ceb95 https://www.webofscience.com/wos/woscc/full-record/WOS:000451218700050