DTRON : a tool for distributed model-based testing of time critical applications
Anier, Aivo
;
Vain, Jüri
;
Tsiopoulos, Leonidas
Proceedings of the Estonian Academy of Sciences
2017
/
p. 75-88 : ill
https://doi.org/10.3176/proc.2017.1.08
http://www.ester.ee/record=b2355998*est
https://www.scopus.com/sourceid/11500153303
https://www.scopus.com/record/display.uri?eid=2-s2.0-85030699053&origin=inward&txGid=749edb5e9019b0a53f7fcbbb58d68a84
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=P%20EST%20ACAD%20SCI&year=2017
https://www.webofscience.com/wos/woscc/full-record/WOS:000396591200009