• Model based testing of distributed time critical systemsVain, Jüri; Kanter, Gert; Srinivasan, Seshadhri2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO 2017) : Noida, India 20-22 September 20172017 / p. 99-105 : ill https://doi.org/10.1109/ICRITO.2017.8342406