Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
Blyzniuk, M.
;
Kazymyra, I.
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2001
/
p. 2023-2040 : ill
https://www.sciencedirect.com/science/article/pii/S0026271401000920