• Shallow defect density determination in CuIn3Se5 thin film photoabsorber by impedance spectroscopyLaes, Kristjan; Bereznev, Sergei; Tverjanovich, Andrey; Borisov, Evgeny N.; Varema, Tiit; Volobujeva, Olga; Öpik, AndresThin solid films2009 / p. 2286-2290 : ill