Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IET computers and digital techniques
2009
/
5, p. 476-486 : ill
http://dx.doi.org/10.1049/iet-cdt.2008.0096