• Phase composition of selenized Cu2ZnSnSe4 thin films determined by X-ray diffraction and Raman spectroscopyGanchev, Maxim; Iljina, Julia; Kaupmees, Liina; Raadik, Taavi; Volobujeva, Olga; Mere, Arvo; Altosaar, Mare; Raudoja, Jaan; Mellikov, EnnThin solid films2011 / p. 7394-7398 : ill