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• Diagnosis and correction of multiple design errors using critical path tracing and mutation analysisHantson, Hanno; Repinski, Urmas; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / [6 p.] : ill https://ieeexplore.ieee.org/document/6261234
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• Mutations for testing hardware and correcting design errorsHantson, HannoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 105-108 : ill
• On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill https://link.springer.com/article/10.1007/s10836-012-5303-6