Machine Learning-Based High-Voltage Circuit Breaker Defect Classification Utilizing Savitzky-Golay Filter
Asefi, Sajjad
;
Asefi, Soheil
;
Afshari, Hossein
;
Kilter, Jako
;
Shayesteh, Ebrahim
;
Hilber, Patrik
;
Lindquist, Tommie
IEEE Transactions on Instrumentation and Measurement
2025
/
art. 3557009
https://doi.org/10.1109/TIM.2025.3604980
https://www.scopus.com/sourceid/15361
https://www.scopus.com/pages/publications/105015171174?origin=resultslist
https://www.webofscience.com/wos/woscc/full-record/WOS:001569579700020