• CAD of CCD VLSIZaycev, S.N.; Kanunnikov, A.I.; Pugachev, A.A.; Shilin, V.A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 120-122: ill https://www.ester.ee/record=b1064031*est
• Simulation of charge transfer in CCDs for low temperature applicationsZaycev, S.N.; Zinis, K.A.; Chernokogin, V.V.; Shilin, V.A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 123-126 https://www.ester.ee/record=b1064031*est