Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faults
Ubar, Raimund-Johannes
;
Borrione, Dominique
Proceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 1998
1998
/
p. 73-79
https://www.researchgate.net/publication/238687832_Localization_of_Single_Gate_Design_Errors_in_Combinational_Circuits_by_Diagnostic_Information_about_Stuck-at_Faults