Sequential circuit test generation using decision diagram models
Raik, Jaan
;
Ubar, Raimund-Johannes
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
1999
/
p. 736-740: ill
https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf