• Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill