Fast static compaction of test sequences using implications and greedy search
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest
2001
/
p. 207-209 : ill
https://www.semanticscholar.org/paper/Fast-Static-Compaction-of-Test-Sequences-using-and-Raik-Jutman/3a7a8ddda6e63d3e2fde0c8650d4518851746221