Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]
Kropman, Daniel
;
Kärner, T.
;
Abru, Uno
;
Ugaste, Ülo
;
Mellikov, Enn
Proceedings IVC-16 : Venice, 2004
2004
/
p. SS1-TuP394 [CD-ROM]
https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties