Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings2007 / p. 165-170 : illhttps://www.researchgate.net/publication/221153650_Parallel_fault_backtracing_for_calculation_of_fault_coverage