• Calculation of LFSR seed and polynomial pair for BIST applications [Electronic resource]Jutman, Artur; Tšertov, Anton; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 275-279 : ill. [CD-ROM] https://ieeexplore.ieee.org/abstract/document/4538801