• Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill
• Data-driven cross-layer fault management architecture for sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, Jaan16th European Dependable Computing Conference : EDCC 2020 : Virtual Conference, Munich, Germany, 7-10 September 2020 : proceedings2020 / art. 20094188, p. 33-40 https://doi.org/10.1109/EDCC51268.2020.00015
• Fault management techniques to enhance the reliability of power electronic converters : an overviewRahimpour, Saeed; Husev, Oleksandr; Vinnikov, Dmitri; Vosoughi Kurdkandi, Naser; Tarzamni, HadiIEEE Access2023 / p. 13432-13446 https://doi.org/10.1109/ACCESS.2023.3242918 https://www.scopus.com/sourceid/21100374601 https://www.scopus.com/record/display.uri?eid=2-s2.0-85148417672&origin=inward&txGid=639225cef935c017c7e861d37e220e88 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20ACCESS&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:000938006000001
• From online fault detection to fault management in network-on-chips : a ground-up approachAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Nevin, George; Oyeniran, Adeboye Stephen; Putkaradze, Tsotne; Apneet Kaur; Raik, Jaan; Jervan, Gert; Ubar, Raimund-Johannes; Hollstein, ThomasProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 48-53 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
• Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-85037723856&origin=inward&txGid=43952d2af7eb29d9046c148b7fce363e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2017 https://www.webofscience.com/wos/woscc/full-record/WOS:000416261800004
• IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill https://www.academia.edu/22101517/IEEE_P1687_IJTAG_demonstrator_on_FPGA
• Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAGJutman, Artur; Devadze, Sergei; Aleksejev, Jevgeni6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France2011 / [4] p.: ill https://ieeexplore.ieee.org/document/5981520
• On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562
• On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342
• Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605
• Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 https://www.scopus.com/record/display.uri?eid=2-s2.0-85212426533&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FDFT63277.2024.10753541%29&sessionSearchId=f890857a41c36254c0f644edbb3c2ac3&relpos=0
• Systematic review of fault tolerant techniques in underwater sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, JaanSensors2021 / art. 3264 https://doi.org/10.3390/s21093264 https://www.scopus.com/sourceid/130124 https://www.scopus.com/record/display.uri?eid=2-s2.0-85105394259&origin=inward&txGid=b17e09f7967915fe073c1a23baec1b5e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SENSORS-BASEL&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000650755700001
• System-wide fault management based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 81-84 : ill