About robustness of test patterns regarding multiple faults
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
p. 86-91 : ill
https://www.infona.pl/resource/bwmeta1.element.ieee-art-000006261243