Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Ubar, Raimund-Johannes (author)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
834
Look more..
(4/144)
Export
export all inquiry results
(834)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
501
book article
Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
2013
/
[1] p
book article
502
book article
New built-in self-test scheme for SoC interconnect
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
2005
/
p. 19-24 : ill
book article
503
book article
New categories of Safe Faults in a processor-based Embedded System
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Piumatti, Davide
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Ubar, Raimund-Johannes
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/DDECS.2019.8724642
book article
504
book article
New curricula and a competence centre through TEMPUS at the Technical University of Tallinn
Glesner, M.
;
Hollstein, Thomas
;
Courtois, B.
;
Amblar, P.
;
Ubar, Raimund-Johannes
;
Vainomaa, Kaido
Workshop on Design Methodologies for Microelectronics, Smolenice castle, Slovakia, September 11-13, 1995 : proceedings
1995
/
p. 347-353
book article
505
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
506
book article
New method of testability calculation to guide RT-level test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
2003
/
p. 46-51 : ill
https://link.springer.com/article/10.1007/s10836-005-5288-5
book article
507
book article
New technique for hierarchical identification of untestable faults in sequential circuits
Krivenko, Anna
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Kruus, Margus
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
lk. 155-158 : ill
book article
508
journal article
New test design techniques for fault detection in digital objects
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
Tallinna Tehnikaülikooli Toimetised
1990
/
lk. 45-62: ill
journal article
509
book article
A novel artificial neural networks based automatic adaptive fault detection technique for analog circuits
Petlenkov, Eduard
;
Jutman, Artur
;
Nõmm, Sven
;
Ubar, Raimund-Johannes
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 167-170 : ill
book article
510
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
511
book article
Off-line testing of crosstalk induced glitch faults in NoC Interconnects
Bengtsson, Tomas
;
Kumar, Shashi
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 221-225 : ill
http://dx.doi.org/10.1109/NORCHP.2006.329215
book article
512
book article
Off-line testing of delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Peng, Zebo
;
Ubar, Raimund-Johannes
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 677-680 : ill
http://dx.doi.org/10.1109/DSD.2006.72
book article
513
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
514
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
515
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
516
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
517
book article
On the combined use of HLDDs and EFSMs for functional ATPG
Di Guglielmo, Giuseppe
;
Fummi, Franco
;
Jenihhin, Maksim
;
Pravadelli, Graziano
;
Raik, Jaan
;
Ubar, Raimund-Johannes
5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia
2007
/
p. 503-508 : ill
book article
518
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
journal article
519
book article
On using genetic algorithm for test generation
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 233-236 : ill
book article
520
book article
On-line monitoring of dialysis adequacy using diasens optical sensor: accurate Kt/V estimation by smoothing algorithms
Talisainen, Aleksei
;
Kostin, Sergei
;
Karai, Deniss
;
Fridolin, Ivo
;
Ubar, Raimund-Johannes
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 273-276 : ill
book article
521
journal article
Open-source JTAG simulator bundle for labs
Shibin, Konstantin
;
Devadze, Sergei
;
Rosin, Vjatšeslav
;
Jutman, Artur
;
Ubar, Raimund-Johannes
International journal of electronics and telecommunications
2012
/
p. 233-239 : ill
https://journals.pan.pl/Content/87192/PDF/32.pdf
journal article
522
book
Operatsioonautomaadid digitaalarvutites : metoodiline materjal
1987
https://www.ester.ee/record=b1234461*est
book
523
book article
Optimierte Steuerung der Fehlersuche auf digitalen Leiterplatten
Thomä, E.
;
Ubar, Raimund-Johannes
Proceedings of the 27th International Conference, Technical University of Ilmenau, October, 1982
1982
/
p. 65-68
book article
524
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
525
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
2007
/
p. 71-77
https://ieeexplore.ieee.org/document/4297319
book article
Number of records 834, displaying
501 - 525
previous
17
18
19
20
21
22
23
24
25
26
next
CV
59
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Aavik, Eduard-Johannes
5.
Ahrenschild, Johannes (-1936)
6.
Alaots, Johannes
7.
Aljak, Arnold Johannes
8.
Allik, Erich-Johannes
9.
Avik, Eduard Johannes 1891-1942
10.
Drechsler, Wolfgang Johannes Max
11.
Ehala, Johannes 1986
12.
Hint, Johannes 1914-1985
13.
Johannes, Ille 1939
14.
Johannson, Johannes
15.
Johanson, Johannes
16.
Juhans, Johannes 1874-1956
17.
Kajander, Aleksi Oskar Johannes 1994
18.
Kiiwet, Johannes
19.
Kiivet, Johannes 1879-1967
20.
Kivit, Johannes
21.
Kollist, Johannes 1884-1937
22.
Kollist, Johannes Theodor
23.
Korv, August Johannes 1911-1981
24.
Krimmer, Robert Johannes
25.
Käpp, Martin Johannes
26.
Langel, Johannes 1900-1985
27.
Langell, Johannes
28.
Livländer, Robert Johannes
29.
Madise, Johannes 1920
30.
Matsulevitš, Johannes
31.
Meitre, Johannes 1906-1978
32.
Messer, Johannes
33.
Muru, Johannes 1995
34.
Mäll, Johannes 1911-1981
35.
Mühlman, Johannes
36.
Mühlmann, Johannes 1888-1936
37.
Notermans, Antonius Johannes Hubertus 1959
38.
Nuudi, Johannes 1895-1975
39.
Palo, Johannes 1925-1960
40.
Pals, Johannes 1903-1941
41.
Pello, Johannes 1958
42.
Pervik, Johannes 1892-1958
43.
Presmann, Johannes 1942
44.
Putk, Aksel-Johannes 1928-1999
45.
Püümann, Mait Johannes
46.
Renter, Olav-Johannes
47.
Roes, Johannes 1914
48.
Russwurm, Johannes
49.
Russvurm, Johannes 1855-1939
50.
Russvurm, Johannes Carl Gysbert Immanuel
51.
Sakeus, Johannes 1880-1934
52.
Taimsalu, Johannes 1891-1942
53.
Teiman, Johannes
54.
Teimann, Johannes Rudolf (kuni 22.05.1935)
55.
Tomson, Johannes
56.
Tuulre, Feliks Johannes 1908-1987
57.
Veerus, Johannes Voldemar 1897-1972
58.
Verus, Johannes Voldemar
59.
Vuhk, Oskar Johannes
author
56
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Avik, Eduard Johannes
6.
Bauer, Johannes
7.
Bender, Naatan Johannes
8.
Buchmann, Johannes
9.
Deelstra, Johannes
10.
Ehala, Johannes
11.
Engelmayer, Johannes
12.
Gotzmann, Johannes
13.
Helander, Johannes
14.
Hint, Johannes
15.
Hüsse, Johannes
16.
Johannes, Anu
17.
Johannes, Ellen
18.
Johannes, Ille
19.
Johannes, Kaljo-Mihkel
20.
Järv, Johannes
21.
Kadak, Johannes
22.
Kajander, Aleksi Oskar Johannes
23.
Karstensen, Johannes
24.
Kerkhoven, Eduard Johannes
25.
Kiivet, Johannes
26.
Krimmer, Robert Johannes
27.
Kukebal, Johannes
28.
Meitre, Johannes
29.
Miller, Johannes
30.
Mühlman, Johannes
31.
Norberg, Johannes
32.
Notermans, Antonius Johannes Hubertus
33.
Ortlepp, Johannes
34.
Parikas, Johannes
35.
Pello, Johannes
36.
Pervik, Johannes-Eduard
37.
Piiper, Johannes
38.
Presmann, Johannes
39.
Putk, Aksel-Johannes
40.
Pätsch, Johannes
41.
Saar, Johannes
42.
Sautter, Johannes
43.
Sinisalo, Touko Johannes
44.
Steinbrunn, Johannes
45.
Sutt, Johannes
46.
Zeiringer, Johannes Paul
47.
Taimsalu, Johannes
48.
Talu, Martin Johannes
49.
Tammekänd, Johannes
50.
Tilk, Johannes
51.
Tralla, Johannes
52.
Veerus, Johannes
53.
Vibur, Johannes Ferdinand
54.
Vind, Johannes
55.
Voll, Johannes
56.
Voltri, Johannes
name of the person
28
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käis, Johannes
16.
Lang, Johannes
17.
Maide, Johannes Voldemar
18.
Mossov, Johannes
19.
Pals, Johannes, 1903-1941
20.
Pello, Johannes
21.
Putk, Aksel-Johannes
22.
Rammul, Aleksander Johannes, 1875-1949
23.
Steinbrunn, Johannes
24.
Taimsalu, Johannes, 1891-1942
25.
Talu, Martin Johannes
26.
Veerus, Johannes Voldemar, 1897-1972
27.
Veski, Johannes Voldemar, 1873-1968
28.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT