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testimine (subject term)
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501
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
502
book article
Towing test tank control system
Tamre, Mart
;
Liyanage, Dhanushka Chamara
;
Hiiemaa, Maido
NCSIE : труды Международной мультиконференции Сетевое партнерство в науке, промышленности и образовании : Санкт-Петербург, Россия, 4-6 июля 2016
2016
/
p. 275-282 : ill
book article
503
book article
Toxicities of detergents used in cleaning chemichals and hygiene products in a test battery of Ex Vivo and in Vitro assays
Andersson, Maria A.
;
Nagy, Szabolcs
;
Mikkola, Raimo
;
Kurnitski, Jarek
;
Salonen, Heidi
Sisäilmastoseminaari 2019 : 14.3.2019
2019
/
p. 297-302
https://www.sisailmauutiset.fi/Sisailmastoseminaari_2019.pdf
book article
504
book article
Trainer 1149 : a boundary scan simulation bundle with hardware support for labs
Shibin, Konstantin
;
Jutman, Artur
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 135-138 : ill
book article
505
book article
Trainer 1149: a boundary scan simulation bundle for labs
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Shibin, Konstantin
;
Rosin, Vjatšeslav
MIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland
2011
/
p. 520-525
book article
506
book article
Transportvõrkude testimistulemuste analüüs
Kravets, Valeri
Raadiotehnika 2001 : VIII rahvusvahelise telekommunikatsioonipäeva materjalid
2001
/
lk. 42-45 : ill
book article
507
book article
TTBist: a DfT tool for enhancing functional test for SoC
Hermann, K.
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 191-194 : ill
book article
508
newspaper article
TTÜ katsetas arvutihiiri : [tootearenduse tudengid Birthe Matsi ja Triin Toon]
Üliõpilasleht
2005
/
lk. 4
newspaper article
509
journal article
TTÜ teadlased arendasid maailmas ainulaadse narkotestri
Männiste, Agnes
Mente et Manu
2017
/
lk. 18-21 : fot
http://www.ttu.ee/public/m/mente-et-manu/MM_01_2017/index.html
https://artiklid.elnet.ee/record=b2811464*est
journal article
510
newspaper article
TTÜ testib veine rohelisel moel
Olesk, Arko
Postimees
2012
/
lk. 6
https://www.postimees.ee/800228/ttu-testib-veine-rohelisel-moel
newspaper article
511
newspaper article
TTÜ-s testiti esimesena maailmas arvutihiirte täpsust
Ummelas, Mart
Õpetajate Leht
2005
/
26. aug., lk. 18
https://artiklid.elnet.ee/record=b2347931*est
newspaper article
512
book article
Turning JTAG inside out for fast extended test access
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil
2009
/
[6] p. : ill
https://ieeexplore.ieee.org/document/4813799
book article
513
journal article EST
/
journal article ENG
A Two-layered approach for the validation of an operational autonomous shuttle
Malayjerdi, Mohsen
;
Goss, Quentin A.
;
Akbas, Mustafa Ilhan
;
Sell, Raivo
;
Bellone, Mauro
IEEE Access
2023
/
p. 89124−89137
https://doi.org/10.1109/ACCESS.2023.3306602
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Scenario-based validation of safety and performance of an autonomous vehicle by a software in loop simulation method = Autonoomse sõiduki ohutuse ja jõudluse stsenaariumipõhine valideerimine tsüklisimulatsiooni meetodi abil
514
book article
Ultra-low latency NoC testing via pseudo-random test pattern compaction
Tatenguem, Herve
;
Govind, Vineeth
;
Raik, Jaan
SoC 2012 : International Symposium on System-on-Chip 2012 : Tampere, Finland, October 11-12, 2012
2012
/
6 p. : ill
https://ieeexplore.ieee.org/document/6376370
book article
515
book article
Understanding boundary scan test with Trainer 1149
Jutman, Artur
;
Devadze, Sergei
;
Shibin, Konstantin
;
Rosin, Vjatšeslav
;
Ubar, Raimund-Johannes
22nd EAEEIE annual conference : June, 13-15, 2011, Maribor, Slovenija : conference book
2011
/
p. 21-22
https://ieeexplore.ieee.org/document/6165727
book article
516
book article
Unmanned ground vehicle energy efficiency validation in territory surveillance mission
Väljaots, Eero
;
Sell, Raivo
;
Rimasauskas, Marius
Mechatronic Systems and Materials VII
2016
/
p. 164-170
http://dx.doi.org/10.4028/www.scientific.net/SSP.251.164
book article
517
book article
Unsupervised fouling reconstruction in the pipe bend
Iablonskyi, Denys
;
Rasgado Moreno, Carlos Omar
;
Ratassepp, Madis
;
Klami, Arto
;
Hæggström, Edward
;
Salmi, Ari
2023 IEEE International Ultrasonics Symposium (IUS)
2023
/
3 p
https://doi.org/10.1109/IUS51837.2023.10306373
book article
518
journal article EST
/
journal article ENG
Use of a newly-developed portable capillary electrophoresis analyser to detect drugs of abuse in oral fluid: A case study
Saar-Reismaa, Piret
;
Brilla, Chelsa-Ann
;
Leiman, Kristiina
;
Kaljurand, Mihkel
;
Vaher, Merike
;
Kulp, Maria
;
Mazina-Šinkar, Jekaterina
Talanta
2020
/
art. 120662, 9 p
https://doi.org/10.1016/j.talanta.2019.120662
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
519
book article
Use of luminescent bacteria in toxicity testing
Kahru, Anne
Biobalt'92 : Biotechnology in Estonia, Latvia and Lithuania : Tallinn, November 1992 : conference abstracts
1992
/
p. 33
book article
520
book article
Using constraint solver in Test Pattern Generation Tool
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 14-17 : ill
book article
521
book article
Using simulation statistics for bug localization in RTL designs
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 107-110 : ill
book article
522
journal article EST
/
journal article ENG
Using STLs for effective in-field test of GPUs
Rodriguez Condia, Josie E.
;
Da Silva, Felipe Augusto
;
Bagbaba, Ahmet Cagrl
;
Guerrero-Balaguera, Juan-David
;
Hamdioui, Said
;
Sauer, Christian
;
Reorda, Matteo Sonza
IEEE Design and Test
2023
/
p. 109-117
https://doi.org/10.1109/MDAT.2022.3188573
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
523
book article
Using Tabu Search for optimization of memory-constrained hybrid BIST
Kruus, Helena
;
Jervan, Gert
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 85-88 : ill
book article
524
book article
Using Tabu Search for optimization of memory-constrained hybrid BIST
Kruus, Helena
;
Jervan, Gert
;
Ubar, Raimund-Johannes
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 155-158 : ill
book article
525
book article
Using test pattern generation tool decider in hardware verification
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 166-169 : ill
book article
Number of records 582, displaying
501 - 525
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