Modeling soft-error reliability under variability
author
statement of authorship
Aneesh Balakrishnan; Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Said Hamdioui; Maksim Jenihhin; Dan Alexandrescu
source
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
publisher
year of publication
pages
p. 1-6
conference name, date
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
subject term
keyword
Negative bias temperature instability
thermal variables control
ISSN
2765-933X
ISBN
978-1-6654-1609-2
notes
Bibliogr.: 19 ref
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Balakrishnan, A., Medeiros, G.C., Gürsoy, C.C., Hamdioui, S., Jenihhin, M., Alexandrescu, D. Modeling soft-error reliability under variability // 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021. : IEEE, 2021. p. 1-6.