Number of effective bits for smart sensor as ADC with non-electrical input
                                            author
                                    
                                    
                                
                                            statement of authorship
                                    
                                    
R. Land
                                                    
                                            
                                            source
                                    
                                    
Proceedings of the 10th IMEKO TC-4 International Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modelling and Testing, 17-18 Sept. 1998, Naples, Italy. Vol. 1
                                                    
                                            
                                            location of publication
                                    
                                    
[S.l.]
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 434-438
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                            Land, R. Number of effective bits for smart sensor as ADC with non-electrical input // Proceedings of the 10th IMEKO TC-4 International Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modelling and Testing, 17-18 Sept. 1998, Naples, Italy. Vol. 1. [S.l.], 1998. p. 434-438.