Kropman, D., Kärner, T., Abru, U., Ugaste, Ü., Mellikov, E., Kauk, M.*

full record print

Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formation

author

Kropman, Daniel

Kärner, T.

Abru, Uno

Ugaste, Ülo

Mellikov, Enn

Kauk, Marit

statement of authorship

D.Kropman, T.Kärner, U.Abru, Ü.Ugaste, E.Mellikov, M.Kauk

source

Materials science and engineering : B

journal volume number month

114-115

year of publication

2004

pages

p. 295-298 : ill

url

https://www.sciencedirect.com/science/article/abs/pii/S0921510704003459

ISSN

0921-5107

notes

Bibliogr.: 10 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

metallograafia

transmissioon

elektronmikroskoopia

integraallülitused

defektid

töökindlus

Kropman, D., Kärner, T., Abru, U., Ugaste, Ü., Mellikov, E., Kauk, M.* Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formation // Materials science and engineering : B (2004) 114-115, p. 295-298 : ill. https://www.sciencedirect.com/science/article/abs/pii/S0921510704003459