Key factors in coping with large-scale security vulnerabilities in the eID field
                                            statement of authorship
                                    
                                    
Silvia Lips, Ingrid Pappel, Valentyna Tsap, Dirk Draheim
                                                    
                                            
                                            source
                                    
                                    
Electronic Government and the Information Systems Perspective :7th International Conference, EGOVIS 2018, Regensburg, Germany, September 3–5, 2018 : proceedings
                                                    
                                            
                                            location of publication
                                    
                                    
Cham
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 60-70
                                                    
                                            
                                            series
                                    
                                    
Lecture notes in computer science ; 11032
                                                    
                                            
                                            conference name, date
                                    
                                    
EGOVIS 2018 : 7th International Conference, September 3–5, 2018
                                                    
                                            
                                            conference location
                                    
                                    
Regensburg, Germany
                                                    
                                            
                                            ISSN
                                    
                                    
0302-9743
                                                    
                                            
                                            ISBN
                                    
                                    
978-3-319-98348-6
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 21 ref
                                                    
                                            
                                            scientific publication
                                    
                                    
teaduspublikatsioon
                                                    
                                            
                                            TalTech department
                                    
                                    
                                
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                                            keyword
                                    
                                    
                                            quartile
                                    
                                    
                                
                                            classifier
                                    
                                    
                                
                                            category (general)
                                    
                                    
                                - eID public acceptance : success factors, citizen perception, and impact of electronic identity = eID avalik aktsepteerimine : edutegurid, kodanike pertseptsioon ja elektroonilise identiteedi mõju
- A multifaceted assessment framework for electronic identity schemes = Elektrooniliste autentimisskeemide mitmetahuline hindamise raamistik
                                    Lips S., Pappel I., Tsap V., Draheim D. Key factors in coping with large-scale security vulnerabilities in the eID field // Electronic Government and the Information Systems Perspective :7th International Conference, EGOVIS 2018, Regensburg, Germany, September 3–5, 2018 : proceedings. Cham : Springer Nature, 2018. p. 60-70. (Lecture notes in computer science ; 11032).