print

A critical study of semiconductor device simulation methods

author
Tarnay, K.
statement of authorship
K.Tarnay
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 9-16: ill
subject term
elektroonika
pooljuhtseadised
subject of form
konverentsid
ISBN
9985-59-081-3
notes
Bibl. 6 ref
Tarnay, K. A critical study of semiconductor device simulation methods // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 9-16: ill.