Failure prediction of power devices under reverse surge current conditions
autor
Freidin, Boris
Velmre, Enn
Udal, Andres
vastutusandmed
Boris Freydin, Enn Velmre, and Andres Udal
allikas
ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992
ilmumiskoht
Tokyo
kirjastus/väljaandja
IEEE
ilmumisaasta
1992
leheküljed
p. 118-123: fig
konverentsi nimetus, aeg
The 4th International Symposium on Power Semiconductor Devices, May 1992
konverentsi toimumispaik
Waseda University, Tokyo
leitav
https://doi.org//10.1109/ISPSD.1992.991247
märksõna
pooljuhtseadised
jõuseadised
töökindlus
võtmesõna
Surges
Temperature dependence
Poisson equations
Nonlinear equations
Doping
Electronic packaging thermal management
Semiconductor device packaging
Semiconductor devices
Semiconductor diodes
Charge carrier processes